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Characterization of trap states in buried nitrogen-implanted β-Ga2O3

Mishra, A., Moule, T., Uren, M. J., Wong, M. H., Goto, K., Murakami, H., Kumagai, Y., Higashiwaki, M., Kuball, M. Characterization of trap states in buried nitrogen-implanted β-Ga2O3. Applied Physics Letters (Appl. Phys. Lett.)., 117: 243505 1-7, 2020

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